f a single crystal sample, such as a silicon wafer, is attached to a sample holder and analyzed using an X-ray diffractometer, given the constraints of XRD devices and experimental conditions, draw any two-dimensional reciprocal lattice and Ewald sphere to see what a valid reciprocal space will look like. Also explain why it can be expressed as the above.
f a single crystal sample, such as a silicon wafer, is attached to a sample holder and analyzed using an X-ray diffractometer, given the constraints of XRD devices and experimental conditions, draw any two-dimensional reciprocal lattice and Ewald sphere to see what a valid reciprocal space will look like. Also explain why it can be expressed as the above.
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If a single crystal sample, such as a silicon wafer, is attached to a sample holder and analyzed using an X-ray diffractometer, given the constraints of XRD devices and experimental conditions, draw any two-dimensional reciprocal lattice and Ewald sphere to see what a valid reciprocal space will look like. Also explain why it can be expressed as the above.
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